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1 article(s) from Sudak, Leszek Josef

Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

Zahra Abooalizadeh,
Leszek Josef Sudak and
Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

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Figure 1: TEM image of four different tips employed in the dAFM experiments. The tips are referred to as (a) ...

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Figure 2: Schematic of the non-contact/free resonance and contact resonance frequencies of the AFM cantilever...

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Figure 3: AFM (a) topographic and (b) reverse scan direction lateral force maps of the HOPG obtained by FMM. ...

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Figure 4: (a) Topographic and (b) lateral force maps acquired in the forward scan direction on uncovered and ...

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Figure 5: Line profile of (a) amplitude and (b) phase at uncovered steps acquired with the CR-mode at a conta...

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Figure 6: (a) AFM topographic map of a third area of the HOPG surface containing both uncovered and covered s...

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Figure 7: (a) Amplitude map obtained while the tip traversed four single-height, uncovered atomic steps on an...

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Figure 8: (a) Amplitude map obtained while the tip traversed two single-height uncovered atomic steps on an H...

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Figure 9: (a) Schematic of the physical construction of the cantilever. A piezo actuator (blue rectangle) exc...

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Figure 10: (a) AFM topography image, (b) amplitude, (c) corresponding converted contact stiffness and (d) corr...

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Figure 11: Force–distance curve from the static indentation measurement on an HOPG surface using a cantilever ...

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Figure 12: The elastic modulus map according to the grid pattern in four lines, where each line includes 64 ro...

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Full Research Paper

Published 03 Jul 2019

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